基于桥式电路的氮化镓开关损耗测试

基于桥式电路的氮化镓开关损耗测试

罗欣儿,张雅静,童亦斌,李建国

Test of Gallium Nitride Switching Loss Based on Bridge Circuit

LUO Xiner, ZHANG Yajing, TONG Yibin and LI Jianguo

电源学报 . 2020, (4): 24 -27 . DOI: 10.13234/j.issn.2095-2805.2020.4.24