SiC MOSFET高温栅氧可靠性研究
刘建君, 陈宏, 丁杰钦, 白云, 郝继龙, 韩忠霖
Investigation on Reliability of High-temperature Gate Oxide in SiC MOSFET
LIU Jianjun, CHEN Hong, DING Jieqin, BAI Yun, HAO Jilong, HAN Zhonglin
电源学报
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2024, (1): 147
-152
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DOI: 10.13234/j.issn.2095-2805.2024.1.147