考虑空间辐射-温度耦合效应的DC-DC电源寿命评估

宗怡明, 方艳红, 锁斌

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电源学报 ›› 2026, Vol. 24 ›› Issue (8) : 339-346. DOI: 10.13234/j.issn.2095-2805.2026.8.339
故障诊断与可靠性

考虑空间辐射-温度耦合效应的DC-DC电源寿命评估

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Life Evaluation of DC-DC Power Supply Considering Coupling Effect of Space Radiation and Temperature

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{{article.zuoZheCn_L}}. {{article.title_cn}}. {{journal.qiKanMingCheng_CN}}. 2026, 24(8): 339-346 https://doi.org/10.13234/j.issn.2095-2805.2026.8.339
{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2026, 24(8): 339-346 https://doi.org/10.13234/j.issn.2095-2805.2026.8.339

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