半导体GaN功率开关器件灵敏度测试技术

程俊红,肖震霞

PDF(793 KB)
PDF(793 KB)
电源学报 ›› 2020, Vol. 18 ›› Issue (4) : 193-199. DOI: 10.13234/j.issn.2095-2805.2020.4.193
SiC、GaN器件、新型功率器件及其应用

半导体GaN功率开关器件灵敏度测试技术

    {{javascript:window.custom_author_cn_index=0;}}
  • {{article.zuoZhe_CN}}
作者信息 +

Sensitivity Testing Technology for Semiconductor GaN Power Switching Devices

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

本文亮点

{{article.keyPoints_cn}}

HeighLight

{{article.keyPoints_en}}

摘要

{{article.zhaiyao_cn}}

Abstract

{{article.zhaiyao_en}}

关键词

Key words

引用本文

导出引用
{{article.zuoZheCn_L}}. {{article.title_cn}}. {{journal.qiKanMingCheng_CN}}. 2020, 18(4): 193-199 https://doi.org/10.13234/j.issn.2095-2805.2020.4.193
{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2020, 18(4): 193-199 https://doi.org/10.13234/j.issn.2095-2805.2020.4.193

参考文献

参考文献

{{article.reference}}

基金

版权

{{article.copyrightStatement_cn}}
{{article.copyrightLicense_cn}}
PDF(793 KB)

Accesses

Citation

Detail

段落导航
相关文章

/