Online Monitoring Method for SiC MOSFET Gate-oxide Health Status Based on Gate Reference Voltage

YU Shengxu, Student WANG Zhiqiang, XIN Guoqing, SHI Xiaojie, TAN Lingqi, MA Kai

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Journal of Power Supply ›› 2024, Vol. 22 ›› Issue (3) : 248-257. DOI: 10.13234/j.issn.2095-2805.2024.3.248
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Online Monitoring Method for SiC MOSFET Gate-oxide Health Status Based on Gate Reference Voltage

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2024, 22(3): 248-257 https://doi.org/10.13234/j.issn.2095-2805.2024.3.248

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