Research on Component Failure Identification in VBE Device Circuit Boards Using Enhanced SqueezeNet Method

Research on Component Failure Identification in VBE Device Circuit Boards Using Enhanced SqueezeNet Method

LIU Longchen, YANG Yueping, JIA Zhijie, HUANG Yu, TANG Shixiong, TAN Boyang

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Journal of Power Supply ›› 2024, Vol. 22 ›› Issue (3) : 236-247. DOI: 10.13234/j.issn.2095-2805.2024.3.236

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Research on Component Failure Identification in VBE Device Circuit Boards Using Enhanced SqueezeNet Method

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2024, 22(3): 236-247 https://doi.org/10.13234/j.issn.2095-2805.2024.3.236

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