Investigation on Terminal Failure Mechanism of Avalanche Bipolar Junction Transistor in Voltage Ramp Triggering Mode

Investigation on Terminal Failure Mechanism of Avalanche Bipolar Junction Transistor in Voltage Ramp Triggering Mode

WEN Kaijun, LIANG Lin, CHEN Han

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Journal of Power Supply ›› 2024, Vol. 22 ›› Issue (3) : 220-226. DOI: 10.13234/j.issn.2095-2805.2024.3.220

Reliability Analysis

Investigation on Terminal Failure Mechanism of Avalanche Bipolar Junction Transistor in Voltage Ramp Triggering Mode

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2024, 22(3): 220-226 https://doi.org/10.13234/j.issn.2095-2805.2024.3.220

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