Simulation and Analysis of IGBT Dynamic Avalanche Failure Mechanism

GUAN Yanxia, LIU Ting, LIU Yong, DENG Jie, WANG Huiru

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Journal of Power Supply ›› 2024, Vol. 22 ›› Issue (1) : 133-139. DOI: 10.13234/j.issn.2095-2805.2024.1.133
Power Semiconductor Devices

Simulation and Analysis of IGBT Dynamic Avalanche Failure Mechanism

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2024, 22(1): 133-139 https://doi.org/10.13234/j.issn.2095-2805.2024.1.133

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