Research on Mechanism Analysis and Characterization Method for Gate Oxygen Degradation of IGBT Module

Research on Mechanism Analysis and Characterization Method for Gate Oxygen Degradation of IGBT Module

WEI Weiwei, ZHANG Yang, XU Guoqing

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Journal of Power Supply ›› 2021, Vol. 19 ›› Issue (6) : 171-178. DOI: 10.13234/j.issn.2095-2805.2021.24.171

Power Electronic Technology in Micro Grid or Smart Grid

Research on Mechanism Analysis and Characterization Method for Gate Oxygen Degradation of IGBT Module

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2021, 19(6): 171-178 https://doi.org/10.13234/j.issn.2095-2805.2021.24.171

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