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YU Bin,WANG Li,RUAN Ligang.Research on Leakage of Mobile Phone Charger Caused by Y Capacitor[J].JOURNAL OF POWER SUPPLY,2019,17(1):128-135
Research on Leakage of Mobile Phone Charger Caused by Y Capacitor
Received:May 26, 2017  Revised:September 04, 2018
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DOI:10.13234/j.issn.2095-2805.2019.1.128
Keywords:mobile phone charger  leakage  electric shock  Y capacitor
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YU Bin Jiangsu Key Laboratory of New Energy Generation and Power Conversion, Nanjing University of Aeronautics and Astronautics, Nanjing , China
WANG Li Jiangsu Key Laboratory of New Energy Generation and Power Conversion, Nanjing University of Aeronautics and Astronautics, Nanjing , China liwang@nuaa.edu.cn
RUAN Ligang Jiangsu Key Laboratory of New Energy Generation and Power Conversion, Nanjing University of Aeronautics and Astronautics, Nanjing , China
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Abstract:
      More and more attention has been paid to the safety of mobile phone chargers, and Y capacitor is one of the causes of leakage of the charger. In this paper, the problem of leakage of mobile phone chargers caused by Y capacitor is studied based on a 5 V/2 A mobile phone charger, which is most widely used on the market at present. The power structure, USB cable structure, and the structure of this charger are discussed. By analyzing the leakage circuit and equivalent circuit when the Y capacitor is normal or short-circuit breakdown and the waveforms of voltage and current of the key components in the leakage circuit, the relation curve of leakage current vs Y capacitance is summarized. It is concluded that the short-circuit breakdown of Y capacitor as well as the excessive Y capacitance value is one of the causes of electric shock. Finally, simulation and experimental results verified the theoretical analysis.
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