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FANG Xin,ZHOU Luo-wei,YAO Dan,DU Xiong,SUN Peng-ju,WU Jun-ke.An Overview of IGBT Life Prediction Models[J].JOURNAL OF POWER SUPPLY,2014,12(3):14-21
An Overview of IGBT Life Prediction Models
Received:January 04, 2014  Revised:February 27, 2014
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DOI:10.13234/j.issn.2095-2805.2014.3.14
Keywords:IGBT  reliability  failure mechanism  life prediction model  accelerated aging tests
Fund Project:Project Supported by the Key Project of National Natural Science Foundation of China(51137006)
                 
AuthorInstitutionEmail
FANG Xin State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University 20111102153@cqu.edu.cn
ZHOU Luo-wei State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University zluowei@cqu.edu.cn
YAO Dan State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University yaodan007@gmail.com
DU Xiong State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University duxiong@ cqu.edu.cn
SUN Peng-ju State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University spengju@cqu.edu.cn
WU Jun-ke State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University allen_wjk@163.com
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Abstract:
      In applications such as wind-power generation, FACTS, electrical motor traction and aviation, the failures of IGBTs contribute a large part of those of the converters'. Therefore, a number IGBT life prediction models was proposed to study the reliability problems of power converters. To provide more life information about IGBTs in converters for both system reliability designers and terminal users, this paper presented an overview of the development and research status of IGBT life prediction models. Based on different modeling methods, these models can be categorized into analytical models and physical ones. In this paper, the modeling basis of different models were stated respectively. Based on the analysis of common failure mechanisms of IGBT, these models were compared in term of accuracy and popularity. And the paper also illustrated the impact of accelerated aging tests on life prediction models. Finally, the challenges and development trend of IGBT life prediction models were briefly discussed.
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