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余彬,王莉,阮立刚.Y电容引起的手机充电器漏电研究[J].电源学报,2019,17(1):128-135
Y电容引起的手机充电器漏电研究
Research on Leakage of Mobile Phone Charger Caused by Y Capacitor
投稿时间:2017-05-26  修订日期:2018-09-04
DOI:10.13234/j.issn.2095-2805.2019.1.128
中文关键词:  手机充电器  漏电  电击  Y电容
英文关键词:mobile phone charger  leakage  electric shock  Y capacitor
基金项目:
作者单位E-mail
余彬 南京航空航天大学江苏省新能源发电与电能变换重点实验室, 南京 210000  
王莉 南京航空航天大学江苏省新能源发电与电能变换重点实验室, 南京 210000 liwang@nuaa.edu.cn 
阮立刚 南京航空航天大学江苏省新能源发电与电能变换重点实验室, 南京 210000  
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中文摘要:
      手机充电器的安全问题受到越来越多的关注,Y电容是引起手机充电器漏电的一个原因。基于目前市场上应用最为广泛的一款5 V/2 A手机充电器,研究了Y电容引起的手机充电器漏电问题,论述了市电电源结构、USB电缆线结构以及手机充电器结构,详细分析了Y电容正常和Y电容短路击穿两种情况下的漏电回路、等效电路以及漏电回路中关键元件的电压、电流波形,总结了漏电流与Y电容的关系,得到了Y电容短路击穿以及Y电容容值过大是造成人被电击的原因之一,最后通过仿真和实验,验证了理论分析的正确性。
英文摘要:
      More and more attention has been paid to the safety of mobile phone chargers, and Y capacitor is one of the causes of leakage of the charger. In this paper, the problem of leakage of mobile phone chargers caused by Y capacitor is studied based on a 5 V/2 A mobile phone charger, which is most widely used on the market at present. The power structure, USB cable structure, and the structure of this charger are discussed. By analyzing the leakage circuit and equivalent circuit when the Y capacitor is normal or short-circuit breakdown and the waveforms of voltage and current of the key components in the leakage circuit, the relation curve of leakage current vs Y capacitance is summarized. It is concluded that the short-circuit breakdown of Y capacitor as well as the excessive Y capacitance value is one of the causes of electric shock. Finally, simulation and experimental results verified the theoretical analysis.
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